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dc.contributor.authorHarcombe, David M.
dc.contributor.authorRuppert, Michael G.
dc.contributor.authorRagazzon, Michael Remo Palmén
dc.contributor.authorFleming, Andrew J.
dc.date.accessioned2019-03-29T08:20:39Z
dc.date.available2019-03-29T08:20:39Z
dc.date.created2019-01-10T12:29:37Z
dc.date.issued2018
dc.identifier.citationBeilstein Journal of Nanotechnology. 2018, 9 490-498.nb_NO
dc.identifier.issn2190-4286
dc.identifier.urihttp://hdl.handle.net/11250/2592328
dc.description.abstractAn important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency components and noise processes, a lock-in amplifier is typically employed for its narrowband response. However, this demodulator suffers inherent bandwidth limitations as high-frequency mixing products must be filtered out and several must be operated in parallel. Many MF-AFM methods require amplitude and phase demodulation at multiple frequencies of interest, enabling both z-axis feedback and phase contrast imaging to be achieved. This article proposes a model-based multifrequency Lyapunov filter implemented on a field-programmable gate array (FPGA) for high-speed MF-AFM demodulation. System descriptions and simulations are verified by experimental results demonstrating high tracking bandwidths, strong off-mode rejection and minor sensitivity to cross-coupling effects. Additionally, a five-frequency system operating at 3.5 MHz is implemented for higher harmonic amplitude and phase imaging up to 1 MHz.nb_NO
dc.language.isoengnb_NO
dc.publisherBeilstein-Institutnb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleLyapunov estimation for high-speed demodulation in multifrequency atomic force microscopynb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber490-498nb_NO
dc.source.volume9nb_NO
dc.source.journalBeilstein Journal of Nanotechnologynb_NO
dc.identifier.doi10.3762/bjnano.9.47
dc.identifier.cristin1654019
dc.description.localcode© 2018 Harcombe et al.; licensee Beilstein-Institut. This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.nb_NO
cristin.unitcode194,63,25,0
cristin.unitnameInstitutt for teknisk kybernetikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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