dc.contributor.author | Lee, Michael S. | |
dc.contributor.author | Wynn, Thomas A. | |
dc.contributor.author | Folven, Erik | |
dc.contributor.author | Chopdekar, Rajesh V. | |
dc.contributor.author | Scholl, Andreas | |
dc.contributor.author | Retterer, Scott | |
dc.contributor.author | Grepstad, Jostein | |
dc.contributor.author | Takamura, Yayoi | |
dc.date.accessioned | 2018-04-25T13:26:16Z | |
dc.date.available | 2018-04-25T13:26:16Z | |
dc.date.created | 2018-01-19T14:04:42Z | |
dc.date.issued | 2017 | |
dc.identifier.issn | 2475-9953 | |
dc.identifier.uri | http://hdl.handle.net/11250/2495997 | |
dc.description.abstract | Soft x-ray photoemission electron microscopy with an in situ magnetic field has been used to study the relationship between ferromagnetic and antiferromagnetic spin alignment and the switching/reversal field of epitaxial micromagnetic structures. We investigated a model system consisting of a bilayer of ferromagnetic La0.7Sr0.3MnO3 and antiferromagnetic LaFeO3 where the spin axes in each layer can be driven from mutually perpendicular (spin-flop) to parallel alignment by varying the temperature between 30 and 300 K. Results show that not only does this spin alignment noticeably influence the bilayer micromagnet coercivity compared to La0.7Sr0.3MnO3 single-layer micromagnets, but the coercivity within this materials system can be tuned over a wide range by careful balance of material properties. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | American Physical Society | nb_NO |
dc.title | Temperature and Orientation Dependent Exchange Coupling in Epitaxial Oxide Micromagnets | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | publishedVersion | nb_NO |
dc.source.volume | 1 | nb_NO |
dc.source.journal | PHYSICAL REVIEW MATERIALS | nb_NO |
dc.identifier.doi | 10.1103/PhysRevMaterials.1.014402 | |
dc.identifier.cristin | 1547602 | |
dc.description.localcode | Published by American Physical Society. | nb_NO |
cristin.unitcode | 194,63,35,0 | |
cristin.unitname | Institutt for elektroniske systemer | |
cristin.ispublished | true | |
cristin.fulltext | original | |