Vis enkel innførsel

dc.contributor.authorRagazzon, Michael Remo Palmén
dc.contributor.authorGravdahl, Jan Tommy
dc.contributor.authorVagia, Marialena
dc.date.accessioned2018-03-07T12:59:34Z
dc.date.available2018-03-07T12:59:34Z
dc.date.created2018-01-12T14:31:43Z
dc.date.issued2017
dc.identifier.citationMechatronics. 2017.nb_NO
dc.identifier.issn0957-4158
dc.identifier.urihttp://hdl.handle.net/11250/2489250
dc.description.abstractIdentification of mechanical properties of cells has previously been shown to have a great potential and effectiveness on medical diagnosis. As a result, it has gathered increasing interest of researchers over the recent years. Atomic force microscopy has become one of the prime technologies for obtaining such properties. Traditionally, local variations in elasticity has been obtained by mapping contact force during sample indentation to static Hertzian contact models. More recently, multiharmonic methods have allowed for both viscous and elastic measurements of soft samples. In this article, a new technique is presented based on dynamic modeling and identification of the sample. Essentially, the measured signals are mapped to the sample properties of the model in a least-square sense. This approach allows for easy extensibility beyond pure viscoelastic measurements. Furthermore, an iterative modeling approach can be used to best describe the measured data. The technique can be operated in either dynamic indentation viscoelastic mode, or scanning viscoelastic mode. First, a dynamic, viscoelastic model of the sample is presented. Then, the parameter identification method is described, showing exponential convergence of the parameters. A simulation study demonstrates the effectiveness of the approach in both modes of operation.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleViscoelastic Properties of Cells: Modeling and Identification by Atomic Force Microscopynb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.journalMechatronics (Oxford)nb_NO
dc.identifier.doi10.1016/j.mechatronics.2017.09.011
dc.identifier.cristin1541703
dc.description.localcode© 2017 Elsevier Ltd. All rights reserved. This is the authors' accepted and refereed manuscript to the article, locked until 3 October 2019 due to copyright restrictions.nb_NO
cristin.unitcode194,63,25,0
cristin.unitnameInstitutt for teknisk kybernetikk
cristin.ispublishedfalse
cristin.fulltextpostprint
cristin.qualitycode1


Tilhørende fil(er)

Thumbnail

Denne innførselen finnes i følgende samling(er)

Vis enkel innførsel

Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
Med mindre annet er angitt, så er denne innførselen lisensiert som Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal