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dc.contributor.authorPitard, Gilles
dc.contributor.authorLe Goïc, Gaëtan
dc.contributor.authorMansouri, Alamin
dc.contributor.authorFavreliére, Hugues
dc.contributor.authorPillet, Maurice
dc.contributor.authorGeorge, Sony
dc.contributor.authorHardeberg, Jon Yngve
dc.date.accessioned2018-01-24T13:40:30Z
dc.date.available2018-01-24T13:40:30Z
dc.date.created2017-05-29T14:09:24Z
dc.date.issued2017
dc.identifier.isbn978-3-319-59125-4
dc.identifier.urihttp://hdl.handle.net/11250/2479461
dc.description.abstractWe propose a novel methodology for the detection and analysis of visual anomalies on challenging surfaces (metallic). The method is based on a local assessment of the reflectance across the inspected surface, using Reflectance Transformation Imaging data: a set of luminance images captured by a fixed camera while varying light spatial positions. The reflectance, in each pixel, is modelled by means of a projection of the measured luminances onto a basis of geometric functions, in this case, the Discrete Modal Decomposition (DMD) basis. However, a robust detection and analysis of surface visual anomalies requires that the method must not be affected neither by the geometry (sensor and surface orientation) nor by the texture pattern orientation of the inspected surface. We therefore introduce a rotation-invariant representation on the DMD, from which we devise saliency maps representing the local differences on reflectances. The methodology is tested on different engineering metallic samples exhibiting several types of defects. Compared to other saliency assessments, the results of our methodology demonstrate the best performance regarding anomaly detection, localisation and analysis.nb_NO
dc.language.isoengnb_NO
dc.publisherSpringernb_NO
dc.relation.ispartofImage Analysis 20th Scandinavian Conference, SCIA 2017 Tromsø, Norway, June 12–14, 2017 Proceedings, Part I
dc.titleRobust Anomaly Detection Using Reflectance Transformation Imaging for Surface Quality Inspectionnb_NO
dc.typeChapternb_NO
dc.description.versionsubmittedVersionnb_NO
dc.source.pagenumber550-561nb_NO
dc.identifier.cristin1472533
dc.description.localcodeThis chapter will not be available due to copyright restrictions (c) 2017 by Springernb_NO
cristin.unitcode194,63,10,0
cristin.unitnameInstitutt for datateknologi og informatikk
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode1


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