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dc.contributor.authorRahmanpour, Parsa
dc.contributor.authorSælid, Steinar
dc.contributor.authorHovd, Morten
dc.date.accessioned2018-01-05T08:20:55Z
dc.date.available2018-01-05T08:20:55Z
dc.date.created2018-01-04T14:23:41Z
dc.date.issued2017
dc.identifier.citationComputers and Chemical Engineering. 2017, 104 353-365.nb_NO
dc.identifier.issn0098-1354
dc.identifier.urihttp://hdl.handle.net/11250/2475863
dc.description.abstractCommercially, the Czochralski process plays a key role in production of monocrystalline silicon for semiconductor and solar cell applications. However, it is a highly complex batch process which requires careful control throughout the whole crystal production. In the present paper, an iterative method based on model predictive control (MPC) for calculating a new and improved trajectory from a growth run to the next is explored. The method uses the results of the previous growth run in combination with an underlying model which incorporates the complex dynamic effect of the heater temperature on the pulling rate. The motivation behind this choice of strategy is to enhance the quality of the fully grown ingot from one run to the next by applying the most recent estimates of the unknown parameters. The results show that combining MPC, estimation and Run-To-Run control has enabled simulation of effective control of the Czochralski crystallization process.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleRun-To-Run control of the Czochralski processnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber353-365nb_NO
dc.source.volume104nb_NO
dc.source.journalComputers and Chemical Engineeringnb_NO
dc.identifier.doi10.1016/j.compchemeng.2017.05.001
dc.identifier.cristin1535996
dc.description.localcode© 2017. This is the authors’ accepted and refereed manuscript to the article. Locked until 4.5.2019 due to copyright restrictions. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/nb_NO
cristin.unitcode194,63,25,0
cristin.unitnameInstitutt for teknisk kybernetikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode2


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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