Browsing Fakultet for informasjonsteknologi og elektroteknikk (IE) by Journals "Methodology and Computing in Applied Probability"
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Competing Risks Modeling by Extended Phase-Type Semi-Markov Distributions
(Peer reviewed; Journal article, 2021)We present competing risks models within a semi-Markov process framework via the semi-Markov phase-type distribution. We consider semi-Markov processes in continuous and discrete time with a finite number of transient ...