Blar i Institutt for fysikk på tidsskrift "Microscopy and Microanalysis"
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Atomap - Automated Analysis of Atomic Resolution STEM Images
(Journal article, 2017)Atomic resolution scanning transmission electron microscopy (STEM) data contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large ... -
Composition Analysis by STEM-EDX of Ternary Semiconductors by Internal References
(Peer reviewed; Journal article, 2021)A practical method to determine the composition within ternary heterostructured semiconductor compounds using energy-dispersive X-ray spectroscopy in scanning transmission electron microscopy is presented. The method ... -
Crystal Phase Mapping by Scanning Precession Electron Diffraction and Machine Learning Decomposition
(Journal article; Peer reviewed, 2018)Analyzing the distribution of crystal phases is required to understand nanostructures. Conventional analysis in the transmission electron microscope (TEM) include acquiring dark-field (DF) images for each expected crystal ... -
e-DREAM: the European Distributed Research Infrastructure for Advanced Electron Microscopy
(Peer reviewed; Journal article, 2022) -
Mapping the chemistry within, and the strain around, Al-alloy precipitates at atomic resolution by multi-frame scanning transmission electron microscopy
(Journal article; Peer reviewed, 2017)Al-Mg-Si(-Cu)alloys, used primarily in the transportation sector, are strengthened by nano-sized precipitate particles. There is a plethora of possible phases, depending onwhich elements are added to the alloy ... -
Methodology to Improve Strain Measurement in III–V Semiconductors Materials
(Journal article; Peer reviewed, 2017)Geometric phase analysis (GPA), a fast and simple Fourier space method for strain analysis, can give useful information on accumulated strain and defect propagation in multiple layers of InAs/GaAs quantum dot (QD) materials. ... -
On the Use of a Cluster Identification Method and a Statistical Approach for Analyzing Atom Probe Tomography Data for GP Zones in Al–Zn–Mg(–Cu) Alloys
(Peer reviewed; Journal article, 2023)Early-stage clustering in two Al–Mg–Zn(–Cu) alloys has been investigated using atom probe tomography and transmission electron microscopy. Cluster identification by the isoposition method and a statistical approach based ... -
Scanning Precession Electron Diffraction and What We Get Out of Such Data in Studies of Aluminium Alloys
(Peer reviewed; Journal article, 2022) -
Scanning Precession Electron Diffraction Study of Hybrid Precipitates in a 6xxx Series Aluminium Alloy
(Journal article; Peer reviewed, 2017)Obtaining reliable and statistical assessment of nanoscale precipitates to link the microstructure with material properties is a primary objective of transmission electron microscopy (TEM) studies of agehardenable aluminium ... -
Scanning Precession Electron Diffraction to aid Aluminum Alloy Development
(Peer reviewed; Journal article, 2019) -
STEM-based analysis of functional defects in ferroelectric ErMnO3
(Peer reviewed; Journal article, 2021) -
Structural Characterization of Natural Quartz by Scanning TEM
(Journal article; Peer reviewed, 2018)For quartz, despite its industrial importance and an extensive amount of research done on it, there are still open fundamental questions, e.g. regarding crystal defects, phase changes or damage mechanisms under ionizing ... -
Using FIB-SEM as a Platform for the Positioning and Correlated Characterization of III-V Nanowires
(Journal article; Peer reviewed, 2018)