Blar i Institutt for fysikk på forfatter "Yan, Z."
-
Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography
Hunnestad, Kasper Aas; Hatzoglou, hatzoglou; Vurpillot, F.; Nylund, Inger-Emma; Yan, Z.; Bourret, E.; Van Helvoort, Antonius; Meier, Dennis (Peer reviewed; Journal article, 2023)Atom probe tomography (APT) is a 3D analysis technique that offers unique chemical accuracy and sensitivity with sub-nanometer spatial resolution. There is an increasing interest in the application of APT to complex oxides ... -
Moiré fringes in conductive atomic force microscopy
Richarz, Leonie; He, J.; Ludacka, Ursula; Bourret, E.; Yan, Z.; Van Helvoort, Antonius; Meier, Dennis (Journal article; Peer reviewed, 2023)Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on ...