Blar i Institutt for fysikk på forfatter "Yan, Z."

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    • Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography 

      Hunnestad, Kasper Aas; Hatzoglou, hatzoglou; Vurpillot, F.; Nylund, Inger-Emma; Yan, Z.; Bourret, E.; Van Helvoort, Antonius; Meier, Dennis (Peer reviewed; Journal article, 2023)
      Atom probe tomography (APT) is a 3D analysis technique that offers unique chemical accuracy and sensitivity with sub-nanometer spatial resolution. There is an increasing interest in the application of APT to complex oxides ...

    • Moiré fringes in conductive atomic force microscopy 

      Richarz, Leonie; He, J.; Ludacka, Ursula; Bourret, E.; Yan, Z.; Van Helvoort, Antonius; Meier, Dennis (Journal article; Peer reviewed, 2023)
      Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on ...