Blar i Fakultet for ingeniørvitenskap (IV) på tidsskrift "Ultramicroscopy"
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Optimising multi-frame ADF-STEM for high-precision atomic-resolution strain mapping
(Journal article; Peer reviewed, 2017)Annular dark-field scanning transmission electron microscopy is a powerful tool to study crystal defects at the atomic scale but historically single slow-scanned frames have been plagued by low-frequency scanning-distortions ...