Blar i NTNU Open på forfatter "Jerome, Maria"
-
Mueller matrix measurements and modeling pertaining to Spectralon white reflectance standards
Svensen, Øyvind; Kildemo, Morten; Jerome, Maria; Stamnes, Jakob J.; Frette, Øyvind (Journal article; Peer reviewed, 2012)The full Mueller matrix for a Spectralon white reflectance standard was measured in the incidence plane, to obtain the polarization state of the scattered light for different angles of illumination. The experimental setup ... -
Octoxy capped Si nanoparticles synthesized by homogeneous reduction of SiCl4 with crown ether alkalide
Sletnes, Malin; Jerome, Maria; Grande, Tor; Lindgren, Mikael; Einarsrud, Mari-Ann (Journal article; Peer reviewed, 2014)Blue-green luminescent octoxy capped Si nanoparticles were synthesized via homogeneous reduction of SiCl4 with the crown ether alkalide K+(15-crown-5)2K− in tetrahydrofuran. The Si nanoparticles were characterized with ... -
Parametric model of the Mueller matrix of a Spectralon white reflectance standard deduced by polar decomposition techniques
Kildemo, Morten; Jerome, Maria; Ellingsen, Pål Gunnar; Aas, Lars Martin Sandvik (Journal article; Peer reviewed, 2013)Decomposition methods have been applied to in-plane Mueller matrix ellipsometric scattering data of the Spectralon reflectance standard. Data were measured at the wavelengths 532 nm and 1500 nm, using an achromatic optimal ...