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dc.contributor.authorSerru, Théo
dc.contributor.authorNguyen, Nga
dc.contributor.authorBatteux, Michel
dc.contributor.authorRauzy, Antoine Bertrand
dc.date.accessioned2023-05-23T06:40:24Z
dc.date.available2023-05-23T06:40:24Z
dc.date.created2023-03-09T10:32:33Z
dc.date.issued2022
dc.identifier.citationElectronics. 2022, 12 (1), .en_US
dc.identifier.issn2079-9292
dc.identifier.urihttps://hdl.handle.net/11250/3068588
dc.description.abstractIn this article, we present an experiment we conducted with discrete event simulations to analyze the effects of multi-step cyberattacks on the safety of cyber-physical systems. We show how to represent systems, their components (either software and/or hardware), communication links, security measures, and attacks from a malicious intruder. The latter are typically taken from the MITRE ATT&CK knowledge base. The discrete event simulation method makes it possible to represent any event affecting the system. We illustrate our approach by means of an illustrative example involving cyberattacks against the navigation system of an autonomous ship. We show how the formal modeling language AltaRica, primarily dedicated to safety analyses, can assess this illustrative example by representing the system and automatically extracting sequences of attacks, leading to a safety-critical situation, namely the deviation of the ship by the attacker. This article aims to discuss this approach and to outline the lessons learned from our experience.en_US
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleModeling Cyberattack Propagation and Impacts on Cyber-Physical System Safety: An Experimenten_US
dc.title.alternativeModeling Cyberattack Propagation and Impacts on Cyber-Physical System Safety: An Experimenten_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.volume12en_US
dc.source.journalElectronicsen_US
dc.source.issue1en_US
dc.identifier.doi10.3390/electronics12010077
dc.identifier.cristin2132675
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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