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dc.contributor.authorTorabi, Ali Reza
dc.contributor.authorHamidi, Kazem
dc.contributor.authorShahbazian, Behnam
dc.contributor.authorCicero, Sergio
dc.contributor.authorBerto, Filippo
dc.date.accessioned2023-01-17T10:22:29Z
dc.date.available2023-01-17T10:22:29Z
dc.date.created2021-12-07T10:46:09Z
dc.date.issued2021
dc.identifier.citationApplied Sciences. 2021, 11 (9), .en_US
dc.identifier.issn2076-3417
dc.identifier.urihttps://hdl.handle.net/11250/3043941
dc.description.abstractThis work analyzes, both theoretically and experimentally, the fracture process of square specimens weakened by keyhole notches and subjected to compressive stresses. Two materials are covered: general-purpose polystyrene (GPPS) and poly(methyl methacrylate) (PMMA). Firstly, the load-carrying capacity (LCC) of the specimens is determined experimentally. Then, by using the equivalent material concept (EMC) for compressive conditions coupled with the maximum tangential stress (MTS) and the mean stress (MS) criteria, the LCC of the notched specimens is predicted. The results show that by using the approach proposed in the present investigation, not only can the critical loads in the keyhole notched polymeric specimens be precisely predicted, but also the corresponding compressive critical stress of the two mentioned polymers can be successfully estimated.en_US
dc.language.isoengen_US
dc.publisherMDPIen_US
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleExtension of the equivalent material concept to compressive loading: Combination with LEFM criteria for fracture prediction of keyhole notched polymeric samplesen_US
dc.title.alternativeExtension of the equivalent material concept to compressive loading: Combination with LEFM criteria for fracture prediction of keyhole notched polymeric samplesen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.source.pagenumber16en_US
dc.source.volume11en_US
dc.source.journalApplied Sciencesen_US
dc.source.issue9en_US
dc.identifier.doi10.3390/app11094138
dc.identifier.cristin1965440
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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