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dc.contributor.authorEliassen, Simen Nut Hansen
dc.contributor.authorFriis, Jesper
dc.contributor.authorRingdalen, Inga Gudem
dc.contributor.authorMousseau, Normand
dc.contributor.authorTrochet, Mickaël
dc.contributor.authorLi, Yanjun
dc.date.accessioned2020-03-16T10:12:55Z
dc.date.available2020-03-16T10:12:55Z
dc.date.created2019-11-27T17:32:52Z
dc.date.issued2019
dc.identifier.citationPhysical review B (PRB). 2019, 100 (15), .nb_NO
dc.identifier.issn2469-9950
dc.identifier.urihttp://hdl.handle.net/11250/2646907
dc.description.abstractThe energy conversion efficiency of solar cells based on multicrystalline silicon is greatly deteriorated by dislocations. However, an in-depth understanding on the dislocation motion dynamics down to atomic scale is still lacking. In this paper, we propose a novel atomistic approach to simulate the kink migration and kink-pair formation which govern dislocation motion in silicon, namely the kinetic activation-relax technique (k-ART). With this method, long timescale events can be simulated and complex energy landscapes can be explored. Four mechanisms for kink migration are observed, with total activation energy of 0.16, 0.25, 0.32, and 0.25 eV. New nontrivial kink structures that participate in kink migration are identified due to the open-ended search algorithm for saddle points in k-ART. In addition, a new pathway for kink-pair formation, with a minimum activation energy of 1.11 eV is discovered. The effect of shear stress on kink migration is also investigated. It shows that shear stress shifts the energy barriers of available events to lower energies, resulting in a change of the preferred kink-migration mechanism and a reduction of kink-pair formation energynb_NO
dc.language.isoengnb_NO
dc.publisherAmerican Physical Societynb_NO
dc.titleAtomistic approach to simulate kink migration and kink-pair formation in silicon: The kinetic activation-relaxation techniquenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber11nb_NO
dc.source.volume100nb_NO
dc.source.journalPhysical review B (PRB)nb_NO
dc.source.issue15nb_NO
dc.identifier.doi10.1103/PhysRevB.100.155305
dc.identifier.cristin1753368
dc.relation.projectNorges forskningsråd: 255326nb_NO
dc.relation.projectNorges forskningsråd: nn9158knb_NO
dc.description.localcode© American Physical Society 2019. This is the authors accepted and refereed manuscript to the article.nb_NO
cristin.unitcode194,66,35,0
cristin.unitnameInstitutt for materialteknologi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode2


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