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dc.contributor.authorBressan, Stefano
dc.contributor.authorRazavi, Seyed Mohammad Javad
dc.contributor.authorBerto, Filippo
dc.date.accessioned2019-02-26T14:32:59Z
dc.date.available2019-02-26T14:32:59Z
dc.date.created2018-11-26T14:48:54Z
dc.date.issued2018
dc.identifier.citationTheoretical and applied fracture mechanics (Print). 2018, 96 23-30.nb_NO
dc.identifier.issn0167-8442
dc.identifier.urihttp://hdl.handle.net/11250/2587600
dc.description.abstractFatigue behavior of single-crystal silicon notched specimens have been analyzed employing a strain energy density parameter. The micrometric specimens obtained from {1 0 0} and {1 1 0} wafers and characterized by five different crystal orientations have been experimentally tested by performing repetitive bending fatigue tests. Fatigue life has been originally synthesized considering the peak stress at the notch tip. Strain energy density averaged on a control volume around the notch tip has been successively obtained through a 3D finite element model. The radius of the control volume has been calculated analytically for each crystal orientation, considering the static and fatigue mechanical properties of each configuration. The energetic parameter has been finally correlated with fatigue life data of the notched specimens, returning satisfying results and improving the previous data.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.titleBased on energy approach for the fatigue life evaluation of micrometric-sized single-crystal silicon notched specimensnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber23-30nb_NO
dc.source.volume96nb_NO
dc.source.journalTheoretical and applied fracture mechanics (Print)nb_NO
dc.identifier.doi10.1016/j.tafmec.2018.03.015
dc.identifier.cristin1635230
dc.description.localcodeThis article will not be available due to copyright restrictions (c) 2018 by Elseviernb_NO
cristin.unitcode194,64,92,0
cristin.unitnameInstitutt for maskinteknikk og produksjon
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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