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dc.contributor.advisorHansen, Alex
dc.contributor.authorBørseth, Frode Thorsen
dc.date.accessioned2018-09-07T14:02:18Z
dc.date.available2018-09-07T14:02:18Z
dc.date.created2018-05-29
dc.date.issued2018
dc.identifierntnudaim:16240
dc.identifier.urihttp://hdl.handle.net/11250/2561558
dc.description.abstractA detailed account is given of an educational visit with the company Ruden AS, which served as an introduction to the field of Electrical Resistivity Tomagraphy (ERT). The formal Calder\'on problem is presented afterwards, lying at the basis of ERT. The inverse problem is discretized, phrasing it instead in terms of resistor grids and transfer matrices. The general relation between the transfer matrix and traditional measurements is shown. An algorithm for solving the forward problem is derived, and the strategy for using this to solve the inverse problem is formulated. The minimization algorithm to be used, Simulated Annealing (SA), is described and defined. It is shown to correctly invert surface data into an image of the subsurface structure. The scheme does however demonstrate some limitations, which are discussed.
dc.languageeng
dc.publisherNTNU
dc.subjectPhysics (MSPHYS)
dc.titleSolving the Inverse Problem of Electrical Resistivity Tomography by Simulated Annealing
dc.typeMaster thesis


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