Magnetoelectric force microscopy on antiferromagnetic 180 degree domains in Cr2O3

Abstract

Magnetoelectric force microscopy (MeFM) is characterized as methodical tool for the investigation of antiferromagnetic domain states, in particular of the 180 ∘ variety. As reference compound for this investigation we use Cr 2 O 3 . Access to the antiferromagnetic order is provided by the linear magnetoelectric effect. We resolve the opposite antiferromagnetic 180 ∘ domain states of Cr 2 O 3 and estimate the sensitivity of the MeFM approach, its inherent advantages in comparison to alternative techniques and its general feasibility for probing antiferromagnetic order.