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dc.contributor.authorGüleryüz, Hasan
dc.contributor.authorKaus, Ingeborg
dc.contributor.authorBuron, CC
dc.contributor.authorFiliatre, C
dc.contributor.authorHedin, N
dc.contributor.authorBergstrøm, Lennart
dc.contributor.authorEinarsrud, Mari-Ann
dc.date.accessioned2017-10-05T10:53:17Z
dc.date.available2017-10-05T10:53:17Z
dc.date.created2014-10-20T14:07:34Z
dc.date.issued2014
dc.identifier.citationColloids and Surfaces A: Physicochemical and Engineering Aspects. 2014, 443 384-390.nb_NO
dc.identifier.issn0927-7757
dc.identifier.urihttp://hdl.handle.net/11250/2458663
dc.description.abstractUnderstanding of the interactions between particles and the substrate is important for successful sol–gel deposition of thin films. We have studied the deposition of silica nanoparticles on alumina coated surfaces in aqueous electrolytes by optical reflectometry (OR) and a quartz crystal microbalance with dissipation (QCM-D). The deposition of negatively charged silica nanoparticles on positively charged alumina was primarily controlled by the electric diffuse double layer interactions between the substrate and the deposited particles, modulated by the counter-ion release. The build-up of a negative charge on the positively charged substrate resulted in a decrease in the deposition rate with increasing surface coverage. Higher surface coverage of silica nanoparticles was obtained at low pH than at high pH conditions, due to reduced electric diffuse double layer repulsion between the silica nanoparticles. The deposition was enhanced at high pH by increasing the concentration of NaCl due to compression of the electric diffuse double layer. In particular, the repulsion between the silica nanoparticles was efficiently screened at a concentration of NaCl higher than 100 mM and thick silica layers could be deposited at pH = 6 and 8.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleDeposition of silica nanoparticles onto alumina measured by optical reflectometry and quartz crystal microbalance with dissipation techniquesnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber384-390nb_NO
dc.source.volume443nb_NO
dc.source.journalColloids and Surfaces A: Physicochemical and Engineering Aspectsnb_NO
dc.identifier.doi10.1016/j.colsurfa.2013.11.049
dc.identifier.cristin1165334
dc.relation.projectNorges forskningsråd: 182033nb_NO
dc.description.localcodeThis is the authors' accepted and refereed manuscript to the article.nb_NO
cristin.unitcode194,66,35,0
cristin.unitnameInstitutt for materialteknologi
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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