dc.contributor.author | Mehl, Torbjørn | |
dc.contributor.author | Di Sabatino Lundberg, Marisa | |
dc.contributor.author | Adamczyk, Krzysztof | |
dc.contributor.author | Burud, Ingunn | |
dc.contributor.author | Olsen, Espen | |
dc.date.accessioned | 2017-01-26T09:22:19Z | |
dc.date.available | 2017-01-26T09:22:19Z | |
dc.date.created | 2017-01-24T14:39:40Z | |
dc.date.issued | 2016 | |
dc.identifier.citation | Energy Procedia. 2016, 92 130-137. | nb_NO |
dc.identifier.issn | 1876-6102 | |
dc.identifier.uri | http://hdl.handle.net/11250/2428480 | |
dc.description.abstract | Defect related sub-band gap luminescence emissions due to Shockley-Read-Hall recombination in mc-Si wafers have been investigated with spectral photoluminescence imaging, combined with electron backscatter diffraction and dislocation mapping, for p- and n-type wafers, with and without intentionally introduced Fe. The well-known emission with energy 0.807 eV (D1) is found to be correlated with heavily dislocated areas of the wafers with emissions emanating from the immediate vicinity of the defects. A less studied emission with energy centered around 0.7 eV (D07) may be the product of two emissions and is found to exhibit very different characteristics in a boron-doped wafer intentionally contaminated with Fe than in the other samples. There is reason to believe that a radiative recombination pathway with characteristic photons with energy 0.694 eV is present in this sample due to interstitial iron, Fei, while the D3/D4 (0.938 eV/1.00 eV) emission pair is related to the FeB complex. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Elsevier | nb_NO |
dc.rights | Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/deed.no | * |
dc.title | Defects in multicrystalline Si wafers studied by spectral photoluminescence imaging, combined with EBSD and dislocation mapping | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.source.pagenumber | 130-137 | nb_NO |
dc.source.volume | 92 | nb_NO |
dc.source.journal | Energy Procedia | nb_NO |
dc.identifier.doi | 10.1016/j.egypro.2016.07.043 | |
dc.identifier.cristin | 1436754 | |
dc.description.localcode | © 2016 The Authors. Published by Elsevier Ltd. This is an open access article under the CC BY-NC-ND license (http://creativecommons.org/licenses/by-nc-nd/4.0/ ). | nb_NO |
cristin.unitcode | 194,66,35,0 | |
cristin.unitname | Institutt for materialteknologi | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |