Blar i Fakultet for informasjonsteknologi og elektroteknikk (IE) på tidsskrift "Beilstein Journal of Nanotechnology"

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    • A review of demodulation techniques for amplitude-modulation atomic force microscopy 

      Ruppert, Michael G.; Harcombe, David M.; Ragazzon, Michael Remo Palmén; Moheimani, S.O. Reza; Fleming, Andrew J. (Journal article; Peer reviewed, 2017)
      In this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component ...

    • Lyapunov estimation for high-speed demodulation in multifrequency atomic force microscopy 

      Harcombe, David M.; Ruppert, Michael G.; Ragazzon, Michael Remo Palmén; Fleming, Andrew J. (Journal article; Peer reviewed, 2018)
      An important issue in the emerging field of multifrequency atomic force microscopy (MF-AFM) is the accurate and fast demodulation of the cantilever-tip deflection signal. As this signal consists of multiple frequency ...