Blar i Fakultet for informasjonsteknologi og elektroteknikk (IE) på forfatter "Obein, Gael"
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Advancing Material Appearance Measurement: A Cost-Effective Multispectral Imaging System for Capturing SVBRDF and BTF
Ansariasl, Majid; Barbieri, Markus; Obein, Gael; Hardeberg, Jon Yngve (Peer reviewed; Journal article, 2023)This paper introduces a novel system for measuring the appearance of materials by capturing their reflectance represented by Spatially Varying Bidirectional Reflectance Distribution Function (SVBRDF) and Bidirectional ...