• Low Inductive Characterization of Fast-Switching SiC MOSFETs and Active Gate Driver Units 

      Philipps, Daniel Alexander; Xue, Peng; Ubostad, Tobias Nieckula; Iannuzzo, Francesco; Peftitsis, Dimosthenis (Peer reviewed; Journal article, 2023)
      Accurate switching device characterization is necessary for effectively utilizing the technological advantages of Silicon Carbide (SiC) Power Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs) over their Silicon ...