Blar i Institutt for fysikk på emneord "ntnudaim:7776"
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Development and testing of a Linnik Interference Microscope for Sub-surface Inspection of Silicon during moving Indentation
(Master thesis, 2012)Fixed-abrasive diamond wire sawing is a promising technique for reduction of costs related to sawing of silicon wafers for solar cells. The microscopic mechanisms of material removal in the process are however not fully ...