Browsing NTNU Open by Author "Nærland, Tine Uberg"
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Characterization of light induced degradation in crystalline silicon
Nærland, Tine Uberg (Doktoravhandlinger ved NTNU, 1503-8181; 2013:, Doctoral thesis, 2013)Light induced degradation is an unfortunate characteristic of a very commonly used silicon material for solar cells: boron-doped Czochralski silicon. The degradation is attributed to a recombination center that is activated ... -
Direct monitoring of minority carrier density during light induced degradation in Czochralski silicon by photoluminescence imaging
Nærland, Tine Uberg; Angelskår, Hallvard; Marstein, Erik Stensrud (Journal article; Peer reviewed, 2013)In this paper, we present a new method for studying the light induced degradation process, in which the minority carrier density is monitored directly during light soaking by photoluminescence imaging. We show experimentally ... -
Studying light-induced degradation by lifetime decay analysis: Excellent fit to solution of simple second-order rate equation
Nærland, Tine Uberg; Haug, Halvard; Angelskår, Hallvard; Søndenå, Rune; Marstein, Erik Stensrud; Arnberg, Lars (Journal article; Peer reviewed, 2013)Twenty different boron-doped Czochralski silicon materials have been analyzed for light-induced degradation. The carrier lifetime degradation was monitored by an automated quasi-steady-state photoconductance setup with an ...