Blar i NTNU Open på forfatter "Modanese, Chiara"
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Copper in compensated p- and n-type Czochralski silicon: Diffusivity, influence on the majority charge carrier density and mobility
Gaspar, Guilherme Manuel Morais; Modanese, Chiara; Bernardis, Sarah; Enjalbert, N.; Arnberg, Lars; Dubois, S.; Di Sabatino Lundberg, Marisa (Peer reviewed; Journal article, 2022)Copper contamination risks are present throughout the whole crystalline silicon solar cell process flow, namely during ingot growth processes using recycled feedstock, wafer sawing and metallisation. Copper is a fast-diffusing ... -
Impact of compensation on solar grade silicon for photovoltaics
Modanese, Chiara (Doktoravhandlinger ved NTNU, 1503-8181; 2012:51, Doctoral thesis, 2012)The steep increase in the market price for silicon feedstock for solar cells experienced at the beginning of the last decade, coupled with a developing industry, opened the possibility for materials produced from different ... -
Low-Temperature Plasma-Enhanced Atomic Layer Deposition of SiO2 Using Carbon Dioxide
Zhu, Zhen; Sippola, Perttu; Ylivaara, Oili M E; Modanese, Chiara; Di Sabatino Lundberg, Marisa; Mizohata, Kenichiro; Merdes, Saoussen; Lipsanen, Harri; Savin, Hele (Peer reviewed; Journal article, 2019)In this work, we report the successful growth of high-quality SiO2 films by low-temperature plasma-enhanced atomic layer deposition using an oxidant which is compatible with moisture/oxygen sensitive materials. The SiO2 ... -
Methodology to analyse small silicon samples by glow discharge mass spectroscopy using thin wafer mask
Modanese, Chiara; Arnberg, Lars; Di Sabatino, Marisa (Peer reviewed; Journal article, 2015)Glow discharge mass spectrometry (GDMS) is widely used for trace element analysis of bulk solid samples. Thegeometry of the GD source limits the minimum size of the sample, which for the instrument used in this ... -
Nanometer‐Scale Depth‐Resolved Atomic Layer Deposited SiO2 Thin Films Analyzed by Glow Discharge Optical Emission Spectroscopy
Zhu, Zhen; Modanese, Chiara; Sippola, Perttu; Di Sabatino Lundberg, Marisa; Savin, Hele (Journal article; Peer reviewed, 2018)In this contribution, pulsed radio frequency (rf) glow discharge optical emission spectroscopy (GDOES) is used to investigate the film properties of SiO2 deposited by plasma enhanced atomic layer deposition (PEALD), for ...