Blar i NTNU Open på forfatter "Hunnestad, Kasper Aas"

Viser treff 1-6 av 6

    • Atomic-scale 3D imaging of individual dopant atoms in an oxide semiconductor 

      Hunnestad, Kasper Aas; Hatzoglou, Constantinos; Zeeshan, Muhammad; Vullum, Per Erik; Yan, Zewu; Bourret, Edith; Van Helvoort, Antonius; Selbach, Sverre Magnus; Meier, Dennis (Peer reviewed; Journal article, 2022)
      The physical properties of semiconductors are controlled by chemical doping. In oxide semiconductors, small variations in the density of dopant atoms can completely change the local electric and magnetic responses caused ...

    • Correlating laser energy with compositional and atomic-level information of oxides in atom probe tomography 

      Hunnestad, Kasper Aas; Hatzoglou, hatzoglou; Vurpillot, F.; Nylund, Inger-Emma; Yan, Z.; Bourret, E.; Van Helvoort, Antonius; Meier, Dennis (Peer reviewed; Journal article, 2023)
      Atom probe tomography (APT) is a 3D analysis technique that offers unique chemical accuracy and sensitivity with sub-nanometer spatial resolution. There is an increasing interest in the application of APT to complex oxides ...

    • Ferroelectric Domain Engineering Using Structural Defect Ordering 

      Gradauskaite, Elzbieta; Hunnestad, Kasper Aas; Meier, Quintin; Meier, Dennis; Trassin, Morgan (Peer reviewed; Journal article, 2022)
      Ferroelectrics have become indispensable in the development of energy-efficient oxide electronics. Their domain state is closely linked to the final device functionality, making domain engineering in technology-compatible ...

    • Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography 

      hatzoglou, constantinos; Da Costa, Grald; Wells, Peter; Ren, Xiaochen; Geiser, Brian P; Larson, David J; Demoulin, Remi; Hunnestad, Kasper Aas; Talbot, Etienne; Mazumder, Baishakhi; Meier, Dennis; Vurpillot, François (Peer reviewed; Journal article, 2023)
      Atom probe tomography (APT) is a powerful three-dimensional nanoanalyzing microscopy technique considered key in modern materials science. However, progress in the spatial reconstruction of APT data has been rather limited ...

    • Nanoscale Chemical Analysis of Ferroic Materials and Phenomena 

      Hunnestad, Kasper Aas (Doctoral theses at NTNU;2023:397, Doctoral thesis, 2023)
      The discovery of new physical phenomena in materials is closely linked to the progress in characterization and is propelled by the ability to observe and study physical processes occurring at the atomic level. Newly ...

    • Observation of Unconventional Dynamics of Domain Walls in Uniaxial Ferroelectric Lead Germanate 

      Bak, Ohheum; Holstad, Theodor Secanell; Lu, Haidong; Evans, Donald; Hunnestad, Kasper Aas; Wang, Bo; Becker, Petra; Bohatý, Ladislav; Helvoort, Antonius T. J. van; Gregg, J Marty; Meier, Dennis Gerhard; Gruverman, Alexei (Peer reviewed; Journal article, 2020)
      Application of scanning probe microscopy techniques such as piezoresponse force microscopy (PFM) opens the possibility to re‐visit the ferroelectrics previously studied by the macroscopic electrical testing methods and ...