Blar i Institutt for materialteknologi på tidsskrift "Microscopy and Microanalysis"
Viser treff 1-7 av 7
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Crystal Phase Mapping by Scanning Precession Electron Diffraction and Machine Learning Decomposition
(Journal article; Peer reviewed, 2018)Analyzing the distribution of crystal phases is required to understand nanostructures. Conventional analysis in the transmission electron microscope (TEM) include acquiring dark-field (DF) images for each expected crystal ... -
Introducing a Dynamic Reconstruction Methodology for Multilayered Structures in Atom Probe Tomography
(Peer reviewed; Journal article, 2023)Atom probe tomography (APT) is a powerful three-dimensional nanoanalyzing microscopy technique considered key in modern materials science. However, progress in the spatial reconstruction of APT data has been rather limited ... -
Measuring ferroelectric order parameters at domain walls and vortices in hexagonal manganites with atomic resolution STEM
(Journal article; Peer reviewed, 2017) -
On the Use of a Cluster Identification Method and a Statistical Approach for Analyzing Atom Probe Tomography Data for GP Zones in Al–Zn–Mg(–Cu) Alloys
(Peer reviewed; Journal article, 2023)Early-stage clustering in two Al–Mg–Zn(–Cu) alloys has been investigated using atom probe tomography and transmission electron microscopy. Cluster identification by the isoposition method and a statistical approach based ... -
PyEBSDIndex: Indexing Electron Backscattered Diffraction Patterns on the GPU
(Peer reviewed; Journal article, 2023) -
STEM-based analysis of functional defects in ferroelectric ErMnO3
(Peer reviewed; Journal article, 2021) -
Structural Characterization of Natural Quartz by Scanning TEM
(Journal article; Peer reviewed, 2018)For quartz, despite its industrial importance and an extensive amount of research done on it, there are still open fundamental questions, e.g. regarding crystal defects, phase changes or damage mechanisms under ionizing ...