Blar i Institutt for materialteknologi på forfatter "He, J."
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Moiré fringes in conductive atomic force microscopy
Richarz, Leonie; He, J.; Ludacka, Ursula; Bourret, E.; Yan, Z.; Van Helvoort, Antonius; Meier, Dennis (Journal article; Peer reviewed, 2023)Moiré physics plays an important role in characterization of functional materials and engineering of physical properties in general, ranging from strain-driven transport phenomena to superconductivity. Here, we report on ...