Blar i NTNU Open på forfatter "Luo, Hao"
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Industrial applications of digital twins
Jiang, Yuchen; yin, shen; Li, Kuan; Luo, Hao; Kaynak, Okyay (Peer reviewed; Journal article, 2021)A digital twin (DT) is classically defined as the virtual replica of a real-world product, system, being, communities, even cities that are continuously updated with data from its physical counterpart, as well as its ... -
Integrated Learning Approach Based on Fused Segmentation Information for Skeletal Fluorosis Diagnosis and Severity Grading
Liu, Shaochong; Li, Xiang; Jiang, Yuchen; Luo, Hao; Gao, Yanhui; yin, shen (Peer reviewed; Journal article, 2021)Skeletal fluorosis is a form of endemic disease caused by the excessive intake of fluoride. Bone deformation and periosteal calcification are the typical manifestations that can be observed in the images and are usually ... -
A Novel Subspace-Aided Fault Detection Approach for the Drive Systems of Rolling Mills
Huo, Mingyi; Luo, Hao; Yin, Shen; Jiang, Yuchen; Kaynak, Okyay (Journal article; Peer reviewed, 2021)This brief proposes a subspace-aided fault detection approach for the drive systems of strip rolling mills. Considering the impact of the unknown periodic load generated by the strip rolling process, the primary contributions ... -
Quo vadis artificial intelligence?
Jiang, Yuchen; Li, Xiang; Luo, Hao; Yin, Shen; Kaynak, Okay (Peer reviewed; Journal article, 2022)The study of artificial intelligence (AI) has been a continuous endeavor of scientists and engineers for over 65 years. The simple contention is that human-created machines can do more than just labor-intensive work; they ... -
Remaining useful life prediction for ion etching machine cooling system using deep recurrent neural network-based approaches
Wu, Shimeng; Jiang, Yuchen; Luo, Hao; yin, shen (Peer reviewed; Journal article, 2021)The cooling system called flowcool is an important part of the ion mill etching (IME) machine. In the case of the cooling system failure during operation, it will lead to significant impacts on the final quality of wafers. ...