Blar i NTNU Open på forfatter "Helvoort, Antonius T. J. van"
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Application of a long short-term memory for deconvoluting conductance contributions at charged ferroelectric domain walls
Holstad, Theodor Secanell; Ræder, Trygve Magnus; Evans, Donald; Småbråten, Didrik Rene; Krohns, Stephan; Schaab, Jakob; Yan, Zewu; Bourret, Edith; Helvoort, Antonius T. J. van; Grande, Tor; Selbach, Sverre Magnus; Agar, Joshua; Meier, Dennis Gerhard (Peer reviewed; Journal article, 2020)Ferroelectric domain walls are promising quasi-2D structures that can be leveraged for miniaturization of electronics components and new mechanisms to control electronic signals at the nanoscale. Despite the significant ... -
Characterization of ferroelectric domain walls by scanning electron microscopy
Hunnestad, Kasper; Roede, Erik Dobloug; Helvoort, Antonius T. J. van; Meier, Dennis Gerhard (Peer reviewed; Journal article, 2020)Ferroelectric domain walls are a completely new type of functional interface, which have the potential to revolutionize nanotechnology. In addition to the emergent phenomena at domain walls, they are spatially mobile and ... -
Domain imaging of multiferroic K3Nb3B2O12 by transmission electron microscopy
Ryggetangen, Oskar (Master thesis, 2021)En forutsetning for anvendelser av ferroiske forbindelser i funksjonelle apparater på nanoskala er avbildning og karakterisering av deres domenestrukturer. Denne avhandlingen presenterer resultatene av den første studien ... -
Observation of Unconventional Dynamics of Domain Walls in Uniaxial Ferroelectric Lead Germanate
Bak, Ohheum; Holstad, Theodor Secanell; Lu, Haidong; Evans, Donald; Hunnestad, Kasper Aas; Wang, Bo; Becker, Petra; Bohatý, Ladislav; Helvoort, Antonius T. J. van; Gregg, J Marty; Meier, Dennis Gerhard; Gruverman, Alexei (Peer reviewed; Journal article, 2020)Application of scanning probe microscopy techniques such as piezoresponse force microscopy (PFM) opens the possibility to re‐visit the ferroelectrics previously studied by the macroscopic electrical testing methods and ... -
STEM-based analysis of functional defects in ferroelectric ErMnO3
Helvoort, Antonius T. J. van; Mosberg, Aleksander B.; Ludacka, Ursula; Holstad, Theodor Secanell; Evans, Donald M.; Meier, Dennis Gerhard (Peer reviewed; Journal article, 2021) -
Transmission electron microscopy based characterization of CdTe–HgTe core–shell semiconductor nanowires
Bakke, Ragna (Master thesis, 2020)Denne avhandlingen rapporterer resultatene fra tøyningskartlegging på heterostrukturerte CdTe–HgTe kjerne–skallnanotråder, tiltenkt å fungere som kvasiendimensjonale topologiske isolatorer. Tøyningskartlegging har blitt ...