Browsing NTNU Open by Author "MacLaren, Ian"
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Atomap: a new software tool for the automated analysis of atomic resolution images using two-dimensional Gaussian fitting
Nord, Magnus Kristofer; Vullum, Per Erik; MacLaren, Ian; Tybell, Per Thomas Martin; Holmestad, Randi (Journal article; Peer reviewed, 2017)Scanning transmission electron microscopy (STEM) data with atomic resolution can contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the ...