• High resolution crystal orientation mapping of ultrathin films in SEM and TEM 

      Heinig, M. F.; Chatterjee, Dipanwita; Van Helvoort, Antonius; Wagner, Jakob B.; Kadkhodazadeh, S; Ånes, Håkon Wiik; Niessen, F; Bastos da Silva, A. (Peer reviewed; Journal article, 2022)
      Ultrathin metallic films are important functional materials for optical and microelectronic devices. Dedicated characterization with high spatial resolution and sufficient field of view is key to the understanding of the ...