Browsing NTNU Open by Author "Jomâa, Moez"
Now showing items 1-4 of 4
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Assessment of feature engineering and long short-term memory for structure loss identification from process data in monocrystalline silicon growth by the Czochralski method
Sortland, Øyvind Sunde; M'hamdi, Mohammed; Jomâa, Moez (Research report, 2019)Structure loss impairs the quality of monocrystalline ingots and represents a major productivity loss for crystal growers. If structure loss could be predicted in advance it could help reduce the lost production time or ... -
Impact of thermal history on defects formation in the last solid fraction of Cz silicon ingots
Lanterne, Adeline Anne; Gaspar, Guilherme Manuel Morais; Haave, Bjørn; Jomâa, Moez; Søndenå, Rune; Hupfer, Alexander; Hu, Yu; Sabatino, Marisa Di (Journal article; Peer reviewed, 2018)For the first time, the impact of the tail detachment on the quality of the last solid fraction of a Czochralski silicon ingot body is reported. Simulations of the thermal history were performed on CGSim software and showed ... -
Statistical Analysis of Structure Loss in Czochralski Silicon Growth
Sortland, Øyvind Sunde; Jomâa, Moez; M'hamdi, Mohammed; Øvrelid, Eivind Johannes; Di Sabatino Lundberg, Marisa (Chapter, 2019)In Czochralski monocrystalline silicon growth, structure loss (SL) is the loss of the mono-crystalline structure. It represents a significant loss of productivity. In this work, this phenomenon is investigated by statistical ... -
Statistical analysis of structure loss in Czochralski silicon growth
Sortland, Øyvind Sunde; Jomâa, Moez; M'hamdi, Mohammed; Øvrelid, Eivind Johannes; Di Sabatino Lundberg, Marisa (Journal article; Peer reviewed, 2019)In Czochralski monocrystalline silicon growth, structure loss (SL) is the loss of the mono-crystalline structure. It represents a significant loss of productivity. In this work, this phenomenon is investigated by statistical ...