Blar i NTNU Open på forfatter "Holst-Dyrnes, Anne"
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Atomic force microscopy and variable angle spectroscopic ellipsometry of oxidising GaAs substrates for intermediate band solar cells
Holst-Dyrnes, Anne (Master thesis, 2018)The AFM images of the substrate sample revealed pits all over the sample surface that were tens of nanometers deep. The geometry of the pits on the surface seemed to be affected by the geometry of the AFM probe tip, ...