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dc.contributor.authorNahavandchi, Hossein
dc.contributor.authorJoodaki, Gholamreza
dc.date.accessioned2022-05-03T11:56:25Z
dc.date.available2022-05-03T11:56:25Z
dc.date.created2010-03-05T14:52:18Z
dc.date.issued2010
dc.identifier.citationSurvey Review. 2010, 42 (316), 193-206.en_US
dc.identifier.issn0039-6265
dc.identifier.urihttps://hdl.handle.net/11250/2993911
dc.description.abstractMultipath error is a limiting factor for successful ambiguity resolution in precise real-time kinematic GPS positioning, both in the carrier phase and pseudorange measurements. Understanding the temporal characteristics of the multipath errors enables the stochastic modelling of these errors. To do this, dual frequency data as well as data from short baselines of several metres apart are observed and analyzed under different multipath conditions. Further, a covariance model (first order Gauss-Markov in this study), accounting for the multipath errors can be created if the temporal characteristics of the multipath errors are derived. The correlation time parameter is an important factor in the analysis of a random process hence this study. Different baselines are observed to estimate the correlation time of the multipath errors. Longer correlation times are obtained in the carrier phase observations due to the double difference process. Not accounting for the long correlation time usually leads to an overestimation of the accuracy and may affect the determination of the ambiguity parameters. This has been shown through a simple numerical investigation.en_US
dc.language.isoengen_US
dc.publisherTaylor & Francisen_US
dc.subjectGeodesien_US
dc.subjectGeodesyen_US
dc.titleCorrelation Analysis of Multipath Effects in GPS-Code and Carrier Phase Observationsen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionpublishedVersionen_US
dc.rights.holderThis version of the article will not be available due to copyright restrictions by T&Fen_US
dc.subject.nsiVDP::Teknologi: 500en_US
dc.subject.nsiVDP::Technology: 500en_US
dc.subject.nsiVDP::Teknologi: 500en_US
dc.subject.nsiVDP::Technology: 500en_US
dc.source.pagenumber193-206en_US
dc.source.volume42en_US
dc.source.journalSurvey Reviewen_US
dc.source.issue316en_US
dc.identifier.doi10.1179/003962610X12572516251808
dc.identifier.cristin343217
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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