Show simple item record

dc.contributor.authorMa, Haishu
dc.contributor.authorWang, Yi
dc.contributor.authorWang, Kesheng
dc.identifier.citationExpert systems with applications. 2018, 91 442-451.en_US
dc.description.abstractRadio frequency identification (RFID) has been widely used for the automatic identification, tracking and tracing of goods throughout the supply chain from the manufacturer to the customer. However, one technological problem that impedes the productive and reliable use of RFID is the constraint of false positive readings, which refers to tags that are detected accidentally by the reader but not the ones of interest. This paper focuses on the use of machine learning algorithms to identify such RFID readings. A total of 11 statistical features are extracted from received signal strength (RSS) and phase rotations derived from the raw RFID data. Each of the features is highly statistically different to distinguish the false positive readings, but satisfactory classification cannot be achieved when these features are considered individually. Classifiers based on logistic regression (LR), support vector machine (SVM) and decision tree (DT) are constructed, which combine all of the extracted features to classify the RFID readings more effectively. The performance of the classifiers is evaluated in a real-world factory. Results show that SVM provides the highest accuracy of up to 95.3%. DT shows slightly better accuracy (92.85%) than LR (92.75%), while LR has the larger area under the curve (0.976) than DT (0.949). Overall, machine learning algorithms could achieve accuracy of 93% on average. The proposed methodology provides a much more reliable RFID application as false-positive readings are detected immediately without human intervention, which enables a significant potential of fully automatic identification and tracking of goods throughout the supply chain.en_US
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.titleAutomatic detection of false positive RFID readings using machine learning algorithmsen_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.source.journalExpert systems with applicationsen_US
dc.description.localcode© 2017. This is the authors’ accepted and refereed manuscript to the article. This manuscript version is made available under the CC-BY-NC-ND 4.0 license "en_US
cristin.unitnameInstitutt for maskinteknikk og produksjon

Files in this item


This item appears in the following Collection(s)

Show simple item record

Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal