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dc.contributor.authorSunde, Jonas Kristoffer
dc.contributor.authorChristiansen, Emil
dc.contributor.authorThronsen, Elisabeth
dc.contributor.authorWenner, Sigurd
dc.contributor.authorMarioara, Calin Daniel
dc.contributor.authorVan Helvoort, Antonius
dc.contributor.authorHolmestad, Randi
dc.date.accessioned2020-04-14T10:45:41Z
dc.date.available2020-04-14T10:45:41Z
dc.date.created2019-08-09T09:25:43Z
dc.date.issued2019
dc.identifier.citationMicroscopy and Microanalysis. 2019, 25 1920-1921.en_US
dc.identifier.issn1431-9276
dc.identifier.urihttps://hdl.handle.net/11250/2650951
dc.language.isoengen_US
dc.publisherCambridge University Pressen_US
dc.relation.urihttps://doi.org/10.1017/S143192761901033X
dc.rightsAttribution-NonCommercial-NoDerivatives 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.no*
dc.titleScanning Precession Electron Diffraction to aid Aluminum Alloy Developmenten_US
dc.typePeer revieweden_US
dc.typeJournal articleen_US
dc.description.versionacceptedVersionen_US
dc.source.pagenumber1920-1921en_US
dc.source.volume25en_US
dc.source.journalMicroscopy and Microanalysisen_US
dc.identifier.doi10.1017/S143192761901033X
dc.identifier.cristin1714974
dc.relation.projectNorges forskningsråd: 247598en_US
dc.relation.projectNorges forskningsråd: 197405en_US
dc.relation.projectNorges forskningsråd: 247783en_US
dc.relation.projectNorges forskningsråd: 237885en_US
dc.description.localcode© 2019. This is the authors’ accepted and refereed manuscript to the article. This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/en_US
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Attribution-NonCommercial-NoDerivatives 4.0 Internasjonal
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