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dc.contributor.authorMosberg, Aleksander Buseth
dc.contributor.authorRoede, Erik Dobloug
dc.contributor.authorEvans, Donald
dc.contributor.authorHolstad, Theodor S.
dc.contributor.authorBourret, Edith
dc.contributor.authorYan, Zewu
dc.contributor.authorVan Helvoort, Antonius
dc.contributor.authorMeier, Dennis
dc.date.accessioned2020-01-30T11:53:18Z
dc.date.available2020-01-30T11:53:18Z
dc.date.created2019-09-28T15:40:10Z
dc.date.issued2019
dc.identifier.citationApplied Physics Letters. 2019, 115 (12), .nb_NO
dc.identifier.issn0003-6951
dc.identifier.urihttp://hdl.handle.net/11250/2638845
dc.description.abstractA focused ion beam (FIB) methodology is developed to lift out suitable specimens containing charged domain walls in improper ferroelectric ErMnO3. The FIB procedure allows for extracting domain wall sections with well-defined charge states, enabling accurate studies of their intrinsic physical properties. Conductive atomic force microscopy (cAFM) measurements on a 700 nm thick lamella demonstrate enhanced electronic transport at charged domain walls consistent with previous bulk measurements. A correlation is shown between domain wall currents in cAFM and applied ion beam polishing parameters, providing a guideline for further optimization. These results open the door for the study and functionalization of individual domain walls in hexagonal manganites, an important step toward the development of atomic scale domain-wall devices that can operate at low energy.nb_NO
dc.language.isoengnb_NO
dc.publisherAIP Publishingnb_NO
dc.titleFIB lift-out of conducting ferroelectric domain walls in hexagonal manganitesnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber5nb_NO
dc.source.volume115nb_NO
dc.source.journalApplied Physics Lettersnb_NO
dc.source.issue12nb_NO
dc.identifier.doi10.1063/1.5115465
dc.identifier.cristin1730635
dc.relation.projectNorges forskningsråd: NORFABnb_NO
dc.description.localcodeLocked until 18.9.2020 due to copyright restrictions. Published by AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing. The following article appeared in Journal of Applied Physics and may be found at http://dx.doi.org/10.1063/1.5115465nb_NO
cristin.unitcode194,66,20,0
cristin.unitcode194,66,35,0
cristin.unitnameInstitutt for fysikk
cristin.unitnameInstitutt for materialteknologi
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode2


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