Vis enkel innførsel

dc.contributor.authorRandeberg, Lise Lyngsnes
dc.date.accessioned2020-01-13T12:37:08Z
dc.date.available2020-01-13T12:37:08Z
dc.date.created2020-01-11T09:51:05Z
dc.date.issued2019
dc.identifier.citationProceedings of SPIE, the International Society for Optical Engineering. 2019, 10873 .nb_NO
dc.identifier.issn0277-786X
dc.identifier.urihttp://hdl.handle.net/11250/2635982
dc.description.abstractHyperspectral imaging is a generic imaging modality allowing high spectral and spatial resolution over a wide wavelength range from the visible to mid-infrared. Short wavelength infrared (SWIR) hyperspectral imaging is currently becoming an important supplement to spectroscopy in optical diagnostics due to the flexibility and adaptability of the technique. However, due to the complexity of hyperspectral data, the analysis requires a well planned approach. In this paper a simple but effective approach combining dimension reduction and unsupervised classification is suggested. Examples of in vivo hyperspectral data in the SWIR spectral range (950-2500 nm) from human skin bruises and porcine skin burns are presented as examples. Data are processed using the minimum noise fraction transform (MNF), and K-means clustering. K-means clustering was found to perform significantly better if applied to MNF transformed data. The classification results agree well with biopsies, spectral data and visual inspection of injuries. It is thus shown that unsupervised clustering can be a preferable technique in cases where it is challenging to use or interpret results from physics based models, or where the ground truth is lacking or not well defined. The presented results confirm that SWIR hyperspectral imaging indeed is a useful tool for optical characterization of tissue.nb_NO
dc.language.isoengnb_NO
dc.publisherSociety of Photo-optical Instrumentation Engineers (SPIE)nb_NO
dc.titleHyperspectral characterization of tissue in the SWIR spectral range: a road to new insight?nb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber17nb_NO
dc.source.volume10873nb_NO
dc.source.journalProceedings of SPIE, the International Society for Optical Engineeringnb_NO
dc.identifier.doi10.1117/12.2504297
dc.identifier.cristin1770629
dc.description.localcode© 2019 Society of Photo Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.nb_NO
cristin.unitcode194,63,35,0
cristin.unitnameInstitutt for elektroniske systemer
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


Tilhørende fil(er)

Thumbnail

Denne innførselen finnes i følgende samling(er)

Vis enkel innførsel