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dc.contributor.authorNordam, Tor
dc.contributor.authorLetnes, Paul Anton
dc.contributor.authorSimonsen, Ingve
dc.contributor.authorMaradudin, Alexei A.
dc.date.accessioned2019-10-15T06:02:12Z
dc.date.available2019-10-15T06:02:12Z
dc.date.created2012-09-24T11:13:24Z
dc.date.issued2012
dc.identifier.citationOptics Express. 2012, 20 (10), 11336-11350.nb_NO
dc.identifier.issn1094-4087
dc.identifier.urihttp://hdl.handle.net/11250/2622089
dc.description.abstractA nonperturbative, purely numerical, solution of the reduced Rayleigh equation for the scattering of p- and s-polarized light from a dielectric film with a two-dimensional randomly rough surface deposited on a planar metallic substrate, has been carried out. It is found that satellite peaks are present in the angular dependence of the elements of the mean differential reflection coefficient in addition to an enhanced backscattering peak. This result resolves a conflict between the results of earlier approximate theoretical studies of scattering from this system.nb_NO
dc.description.abstractSatellite peaks in the scattering of light from the two-dimensional randomly rough surface of a dielectric film on a planar metal surfacenb_NO
dc.language.isoengnb_NO
dc.publisherOSA Publishingnb_NO
dc.titleSatellite peaks in the scattering of light from the two-dimensional randomly rough surface of a dielectric film on a planar metal surfacenb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber11336-11350nb_NO
dc.source.volume20nb_NO
dc.source.journalOptics Expressnb_NO
dc.source.issue10nb_NO
dc.identifier.doi10.1364/OE.20.011336
dc.identifier.cristin945975
dc.description.localcode© 2012 Optical Society of America. You are allowed to read, download, copy, distribute, print, search, or link to the full texts of the articles, or use them for any other lawful purpose, without asking prior permission from OSA Publishing or the author. This is in accordance with the BOAI definition of open access.nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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