dc.contributor.author | Ren, Lei | |
dc.contributor.author | Zhao, Li | |
dc.contributor.author | Hong, Sheng | |
dc.contributor.author | Zhao, Shiqiang | |
dc.contributor.author | Wang, Hao | |
dc.contributor.author | Zhang, Lin | |
dc.date.accessioned | 2019-09-16T10:42:25Z | |
dc.date.available | 2019-09-16T10:42:25Z | |
dc.date.created | 2019-01-13T19:31:10Z | |
dc.date.issued | 2018 | |
dc.identifier.citation | IEEE Access. 2018, 6 50587-50598. | nb_NO |
dc.identifier.issn | 2169-3536 | |
dc.identifier.uri | http://hdl.handle.net/11250/2616945 | |
dc.description.abstract | Accurate prediction of remaining useful life (RUL) of lithium-ion battery plays an increasingly crucial role in the intelligent battery health management systems. The advances in deep learning introduce new data-driven approaches to this problem. This paper proposes an integrated deep learning approach for RUL prediction of lithium-ion battery by integrating autoencoder with deep neural network (DNN). First, we present a multi-dimensional feature extraction method with autoencoder model to represent battery health degradation. Then, the RUL prediction model-based DNN is trained for multi-battery remaining cycle life estimation. The proposed approach is applied to the real data set of lithium-ion battery cycle life from NASA, and the experiment results show that the proposed approach can improve the accuracy of RUL prediction. | nb_NO |
dc.language.iso | eng | nb_NO |
dc.publisher | Institute of Electrical and Electronics Engineers (IEEE) | nb_NO |
dc.title | Remaining Useful Life Prediction for Lithium-Ion Battery: A Deep Learning Approach | nb_NO |
dc.type | Journal article | nb_NO |
dc.type | Peer reviewed | nb_NO |
dc.description.version | publishedVersion | nb_NO |
dc.source.pagenumber | 50587-50598 | nb_NO |
dc.source.volume | 6 | nb_NO |
dc.source.journal | IEEE Access | nb_NO |
dc.identifier.doi | 10.1109/ACCESS.2018.2858856 | |
dc.identifier.cristin | 1655709 | |
dc.description.localcode | (C) 2018 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission | nb_NO |
cristin.unitcode | 194,63,55,0 | |
cristin.unitname | Institutt for IKT og realfag | |
cristin.ispublished | true | |
cristin.fulltext | original | |
cristin.qualitycode | 1 | |