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dc.contributor.authorLiudi Mulyo, Andreas
dc.contributor.authorKonno, Yuta
dc.contributor.authorNilsen, Julie Stene
dc.contributor.authorVan Helvoort, Antonius
dc.contributor.authorFimland, Bjørn-Ove
dc.contributor.authorWeman, Helge
dc.contributor.authorKishino, Katsumi
dc.date.accessioned2019-04-03T07:07:14Z
dc.date.available2019-04-03T07:07:14Z
dc.date.created2017-10-14T12:59:23Z
dc.date.issued2017
dc.identifier.citationJournal of Crystal Growth. 2017, 480 67-73.nb_NO
dc.identifier.issn0022-0248
dc.identifier.urihttp://hdl.handle.net/11250/2593022
dc.description.abstractWe demonstrate GaN nanocolumn growth on fused silica glass by plasma-assisted molecular beam epitaxy. The effect of the substrate temperature, Ga flux and N2 flow rate on the structural and optical properties are studied. At optimum growth conditions, GaN nanocolumns are vertically aligned and well separated with an average diameter, height and density of 72 nm, 1.2 μm and 1.6 × 109 cm−2, respectively. The nanocolumns exhibit wurtzite crystal structure with no threading dislocations, stacking faults or twinning and grow in the [0 0 0 1] direction. At the interface adjacent to the glass, there is a few atom layers thick intermediate phase with ABC stacking order (zinc blende). Photoluminescence measurements evidence intense and narrow excitonic emissions, along with the absence of any defect-related zinc blende and yellow luminescence emission.nb_NO
dc.description.abstractGrowth study of self-assembled GaN nanocolumns on silica glass by plasma assisted molecular beam epitaxynb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.titleGrowth study of self-assembled GaN nanocolumns on silica glass by plasma assisted molecular beam epitaxynb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber67-73nb_NO
dc.source.volume480nb_NO
dc.source.journalJournal of Crystal Growthnb_NO
dc.identifier.doi10.1016/j.jcrysgro.2017.10.009
dc.identifier.cristin1504630
dc.relation.projectNorges forskningsråd: 259553nb_NO
dc.relation.projectNORTEM: 197405nb_NO
dc.relation.projectNorges forskningsråd: 214235nb_NO
dc.relation.projectNorges forskningsråd: 197411nb_NO
dc.relation.projectNorges forskningsråd: 239206nb_NO
dc.relation.projectNorges forskningsråd: 221860nb_NO
dc.description.localcodePublisher embargo until December 15 2019 (c) This manuscript version is made available under the CC-BY-NC-ND 4.0 license http://creativecommons.org/licenses/by-nc-nd/4.0/nb_NO
cristin.unitcode194,63,35,0
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for elektroniske systemer
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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