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dc.contributor.authorRuppert, Michael G.
dc.contributor.authorHarcombe, David M.
dc.contributor.authorRagazzon, Michael Remo Palmén
dc.contributor.authorMoheimani, S.O. Reza
dc.contributor.authorFleming, Andrew J.
dc.date.accessioned2018-06-28T05:44:26Z
dc.date.available2018-06-28T05:44:26Z
dc.date.created2017-10-20T13:55:58Z
dc.date.issued2017
dc.identifier.citationBeilstein Journal of Nanotechnology. 2017, 8 (1), 1407-1426.nb_NO
dc.identifier.issn2190-4286
dc.identifier.urihttp://hdl.handle.net/11250/2503424
dc.description.abstractIn this review paper, traditional and novel demodulation methods applicable to amplitude-modulation atomic force microscopy are implemented on a widely used digital processing system. As a crucial bandwidth-limiting component in the z-axis feedback loop of an atomic force microscope, the purpose of the demodulator is to obtain estimates of amplitude and phase of the cantilever deflection signal in the presence of sensor noise or additional distinct frequency components. Specifically for modern multifrequency techniques, where higher harmonic and/or higher eigenmode contributions are present in the oscillation signal, the fidelity of the estimates obtained from some demodulation techniques is not guaranteed. To enable a rigorous comparison, the performance metrics tracking bandwidth, implementation complexity and sensitivity to other frequency components are experimentally evaluated for each method. Finally, the significance of an adequate demodulator bandwidth is highlighted during high-speed tapping-mode atomic force microscopy experiments in constant-height mode.nb_NO
dc.language.isoengnb_NO
dc.publisherBeilstein-Institutnb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleA review of demodulation techniques for amplitude-modulation atomic force microscopynb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber1407-1426nb_NO
dc.source.volume8nb_NO
dc.source.journalBeilstein Journal of Nanotechnologynb_NO
dc.source.issue1nb_NO
dc.identifier.doi10.3762/bjnano.8.142
dc.identifier.cristin1506279
dc.description.localcode© 2017 Ruppert et al.; licensee Beilstein-Institut. This is an Open Access article under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.nb_NO
cristin.unitcode194,63,25,0
cristin.unitnameInstitutt for teknisk kybernetikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal