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dc.contributor.authorSole, Aditya Suneel
dc.contributor.authorFarup, Ivar
dc.contributor.authorNussbaum, Peter
dc.contributor.authorTominaga, Shoji
dc.date.accessioned2018-04-19T08:29:04Z
dc.date.available2018-04-19T08:29:04Z
dc.date.created2018-03-06T21:47:04Z
dc.date.issued2018
dc.identifier.citationApplied Optics. 2018, 57 (8), 1918-1928.nb_NO
dc.identifier.issn1559-128X
dc.identifier.urihttp://hdl.handle.net/11250/2494951
dc.description.abstractWe evaluate an image-based multiangle bidirectional reflectance distribution function measurement setup by comparing it to measurements from two commercially available goniospectrophotometers. The image-based setup uses an RGB camera to perform bidirectional measurements of the sample material. We use a conversion matrix to calculate luminance from the captured data. The matrix is calculated using camera spectral sensitivities that are measured with a monochromator. Radiance factor of the sample material is measured using a commercially available tabletop goniospectrophotometer and compared to measurements made using the image-based setup in the colorimetric domain. Our measurement setup is validated by comparing the measurements performed using a goniospectrophotometer. Uncertainty and error propagation is calculated and taken into account for validation. The sample material measured is wax-based ink printed on packaging paper substrate commonly used in the print and packaging industry. Results obtained show that the image-based setup can perform bidirectional reflectance measurements with a known uncertainty. The goniospectrophotometer measurements lie within the uncertainty of the measurements performed by the image-based measurement setup. The setup can be used to perform bidirectional reflectance measurements on samples with properties similar to the samples used in this paper.nb_NO
dc.language.isoengnb_NO
dc.publisherOptical Society of Americanb_NO
dc.titleEvaluating an image-based bidirectional reflectance distribution function measurement setupnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber1918-1928nb_NO
dc.source.volume57nb_NO
dc.source.journalApplied Opticsnb_NO
dc.source.issue8nb_NO
dc.identifier.doihttps://doi.org/10.1364/AO.57.001918
dc.identifier.cristin1570964
dc.description.localcode© 2018 Optical Society of America. Locked until 8.3.2019 due to copyright restrictions. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modifications of the content of this paper are prohibited.nb_NO
cristin.unitcode194,63,10,0
cristin.unitnameInstitutt for datateknologi og informatikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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