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dc.contributor.authorJelle, B.P.
dc.contributor.authorHagen, Georg K
dc.contributor.authorHesjevik, S.M.
dc.contributor.authorØdegård, R.
dc.date.accessioned2018-01-05T11:44:04Z
dc.date.available2018-01-05T11:44:04Z
dc.date.created1999-02-03T00:00:00Z
dc.date.issued1993
dc.identifier.citationElectrochimica Acta. 1993, 38 1643-1647.nb_NO
dc.identifier.issn0013-4686
dc.identifier.urihttp://hdl.handle.net/11250/2476005
dc.description.abstractThe reduction factor as a function of applied potential for polyaniline films, deposited electrochemically on indium—tin oxide glass plates, has been determined from cyclic voltammetry and from visible absorption spectra, generally showing good agreement between the two methods.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.titleReduction Factor for Polyaniline Films on ITO from Cyclic Voltammetry and Visible Absorption Spectranb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber1643-1647nb_NO
dc.source.volume38nb_NO
dc.source.journalElectrochimica Actanb_NO
dc.identifier.doi10.1016/0013-4686(93)85054-3
dc.identifier.cristin414374
dc.description.localcodeThis article will not be available due to copyright restrictions (c) 2001 by Elseviernb_NO
cristin.unitcode194,66,30,0
cristin.unitnameInstitutt for kjemisk prosessteknologi
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode2


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