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dc.contributor.authorSunde, Jonas Kristoffer
dc.contributor.authorJohnstone, Duncan
dc.contributor.authorMarioara, Calin Daniel
dc.contributor.authorVan Helvoort, Antonius
dc.contributor.authorMidgley, Paul A.
dc.contributor.authorHolmestad, Randi
dc.date.accessioned2017-11-06T09:05:03Z
dc.date.available2017-11-06T09:05:03Z
dc.date.created2017-11-04T20:41:16Z
dc.date.issued2017
dc.identifier.citationMicroscopy and Microanalysis. 2017, 23 114-115.nb_NO
dc.identifier.issn1431-9276
dc.identifier.urihttp://hdl.handle.net/11250/2464135
dc.description.abstractObtaining reliable and statistical assessment of nanoscale precipitates to link the microstructure with material properties is a primary objective of transmission electron microscopy (TEM) studies of agehardenable aluminium (Al) alloys. Here, it is demonstrated that nanometer-resolution scanning precession electron diffraction (SPED) [1] combined with versatile post-facto computational analysis provides a route to extract improved precipitate statistics in Al alloys. The approach developed is automated, and offers more objective assessment compared to conventional imaging procedures which require manual identification, counting and measurements. The material studied here is a common 6xxx series industrial alloy (6082, Al-0.72Mg-0.88Si-0.03Cu (wt %)) and the methods developed are generic and applicable to any material containing nanoscale precipitates.nb_NO
dc.language.isoengnb_NO
dc.publisherCambridge University Press (CUP)nb_NO
dc.relation.urihttps://doi.org/10.1017/S1431927617001258
dc.titleScanning Precession Electron Diffraction Study of Hybrid Precipitates in a 6xxx Series Aluminium Alloynb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber114-115nb_NO
dc.source.volume23nb_NO
dc.source.journalMicroscopy and Microanalysisnb_NO
dc.identifier.doi10.1017/S1431927617001258
dc.identifier.cristin1510988
dc.relation.projectNorges forskningsråd: 247783nb_NO
dc.relation.projectNORTEM: 197405nb_NO
dc.description.localcode© Microscopy Society of America 2017. This is the authors’ accepted and refereed manuscript to the article. Locked until 4.2.2018 due to copyright restrictions.nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextpostprint
cristin.qualitycode1


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