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dc.contributor.authorNord, Magnus Kristofer
dc.contributor.authorVullum, Per Erik
dc.contributor.authorMacLaren, I
dc.contributor.authorTybell, Per Thomas Martin
dc.contributor.authorHolmestad, Randi
dc.date.accessioned2017-11-06T09:00:27Z
dc.date.available2017-11-06T09:00:27Z
dc.date.created2017-11-04T23:56:31Z
dc.date.issued2017
dc.identifier.citationMicroscopy and Microanalysis. 2017, 23 426-427.nb_NO
dc.identifier.issn1431-9276
dc.identifier.urihttp://hdl.handle.net/11250/2464132
dc.description.abstractAtomic resolution scanning transmission electron microscopy (STEM) data contain a large amount of information about the structure of a crystalline material. Often, this information is hard to extract, due to the large number of atomic columns and large differences in intensity from sublattices consisting of different elements. Atomap is a semi-automatic, free and open source software tool for analysing both the position and shapes of atomic columns in STEM-images, using 2-D elliptical Gaussian distributions. In this work, the Atomap software is used on variants of the perovskite oxide structure, obtaining quantitative information from projected sublattices. Changes in the lattice parameters and shape of Acation columns from annular dark field images of perovskite oxide heterostructures are obtained. Furthermore, we demonstrate the functionality of Atomap by quantifying deviation from centrosymmerty of light atomic oxygen columns.nb_NO
dc.language.isoengnb_NO
dc.publisherCambridge University Press (CUP)nb_NO
dc.titleAtomap - Automated Analysis of Atomic Resolution STEM Imagesnb_NO
dc.typeJournal articlenb_NO
dc.description.versionsubmittedVersionnb_NO
dc.source.pagenumber426-427nb_NO
dc.source.volume23nb_NO
dc.source.journalMicroscopy and Microanalysisnb_NO
dc.identifier.doi10.1017/S1431927617002811
dc.identifier.cristin1510999
dc.description.localcode© Microscopy Society of America 2017. This is the authors’ submitted manuscript to the article.nb_NO
cristin.unitcode194,66,20,0
cristin.unitcode194,63,35,0
cristin.unitnameInstitutt for fysikk
cristin.unitnameInstitutt for elektroniske systemer
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode1


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