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dc.contributor.authorRagazzon, Michael Remo Palmén
dc.contributor.authorGravdahl, Jan Tommy
dc.contributor.authorPettersen, Kristin Ytterstad
dc.contributor.authorEielsen, Arnfinn Aas
dc.date.accessioned2017-11-02T11:23:10Z
dc.date.available2017-11-02T11:23:10Z
dc.date.created2015-10-20T12:36:06Z
dc.date.issued2015
dc.identifier.citationAmerican Control Conference (ACC). 2015, 2015-July 3496-3502.nb_NO
dc.identifier.issn0743-1619
dc.identifier.urihttp://hdl.handle.net/11250/2463669
dc.description.abstractA novel imaging method for atomic force microscopy based on estimation of state and parameters is presented. The cantilever dynamics is modeled as a linear system augmented by the tip-sample interaction force. The states of this augmented system are observed. The tip-sample force function is based on the Lennard-Jones potential with a nonlinearly parameterized unknown topography parameter. By estimating this parameter together with the tip-sample force using a nonlinear observer approach, the topography of the sample can be found. The observer and parameter estimator is shown to be exponentially stable. Simulation results are presented and compared to a more conventional extended Kalman filter.nb_NO
dc.language.isoengnb_NO
dc.publisherInstitute of Electrical and Electronics Engineers (IEEE)nb_NO
dc.titleTopography and force imaging in atomic force microscopy by state and parameter estimationnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionacceptedVersionnb_NO
dc.source.pagenumber3496-3502nb_NO
dc.source.volume2015-Julynb_NO
dc.source.journalAmerican Control Conference (ACC)nb_NO
dc.identifier.doi10.1109/ACC.2015.7171872
dc.identifier.cristin1281954
dc.relation.projectNorges forskningsråd: 223254nb_NO
dc.description.localcode© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.nb_NO
cristin.unitcode194,63,25,0
cristin.unitnameInstitutt for teknisk kybernetikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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