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dc.contributor.authorNematollahi, Mohammadreza
dc.contributor.authorYang, Xiaodong
dc.contributor.authorAas, Lars Martin Sandvik
dc.contributor.authorGhadyani, Zahra
dc.contributor.authorKildemo, Morten
dc.contributor.authorGibson, Ursula
dc.contributor.authorReenaas, Turid Worren
dc.date.accessioned2017-09-28T10:59:27Z
dc.date.available2017-09-28T10:59:27Z
dc.date.created2015-06-25T17:36:22Z
dc.date.issued2015
dc.identifier.citationSolar Energy Materials and Solar Cells. 2015, 141 322-330.nb_NO
dc.identifier.issn0927-0248
dc.identifier.urihttp://hdl.handle.net/11250/2457278
dc.description.abstractWe have investigated the structural and optical properties of Cr-doped ZnS (ZnS:Cr) thin films (0–7.5 at.% Cr) for use in intermediate band solar cells. The films were grown on Si(100) in molecular beam epitaxy (MBE) and pulsed laser deposition (PLD) equipments. Introducing Cr into ZnS resulted in Cr related subbandgap absorption, but also reduced the grain size. The sub-bandgap absorption increased with increasing Cr content, and with increasing growth temperature, but did not depend on the growth method. In contrast, the crystallinity depended strongly on the growth method, and smoother and highly textured films were obtained by PLD. The data indicate that stacking faults are present in all films.nb_NO
dc.language.isoengnb_NO
dc.publisherElseviernb_NO
dc.titleMolecular beam and pulsed laser deposition of ZnS:Cr for intermediate band solar cellsnb_NO
dc.typeJournal articlenb_NO
dc.description.versionsubmittedVersionnb_NO
dc.source.pagenumber322-330nb_NO
dc.source.volume141nb_NO
dc.source.journalSolar Energy Materials and Solar Cellsnb_NO
dc.identifier.doi10.1016/j.solmat.2015.06.004
dc.identifier.cristin1250833
dc.relation.projectNorges forskningsråd: 219686nb_NO
dc.relation.projectNorges forskningsråd: 193829nb_NO
dc.relation.projectNorges forskningsråd: 203503nb_NO
dc.description.localcodeThis is the authors' submitted manuscript of an article published by Elsevier in Solar Energy Materials and Solar Cells.nb_NO
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextpreprint
cristin.qualitycode2


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