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dc.contributor.authormikkelsen, alexander
dc.contributor.authorDommersnes, Paul Gunnar
dc.contributor.authorRozynek, Zbigniew Jerzy
dc.contributor.authorGholamipour-Shiraz, Azarmidokht
dc.contributor.authorCarvalho, Marcio
dc.contributor.authorFossum, Jon Otto
dc.date.accessioned2017-08-22T07:24:31Z
dc.date.available2017-08-22T07:24:31Z
dc.date.created2017-06-23T13:27:53Z
dc.date.issued2017
dc.identifier.citationMaterials. 2017, 10 436-?.nb_NO
dc.identifier.issn1996-1944
dc.identifier.urihttp://hdl.handle.net/11250/2451349
dc.description.abstractFluid drops coated with particles, so-called Pickering drops, play an important role in emulsion and capsule applications. In this context, knowledge of mechanical properties and stability of Pickering drops are essential. Here we prepare Pickering drops via electric field-driven self-assembly. We use direct current (DC) electric fields to induce mechanical stress on these drops, as a possible alternative to the use of, for example, fluid flow fields. Drop deformation is monitored as a function of the applied electric field strength. The deformation of pure silicone oil drops is enhanced when covered by insulating polyethylene (PE) particles, whereas drops covered by conductive clay particles can also change shape from oblate to prolate. We attribute these results to changes in the electric conductivity of the drop interface after adding particles, and have developed a fluid shell description to estimate the conductivity of Pickering particle layers that are assumed to be non-jammed and fluid-like. Retraction experiments in the absence of electric fields are also performed. Particle-covered drops retract slower than particle-free drops, caused by increased viscous dissipation due to the presence of the Pickering particle layer.nb_NO
dc.language.isoengnb_NO
dc.publisherMDPInb_NO
dc.rightsNavngivelse 4.0 Internasjonal*
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/deed.no*
dc.titleMechanics of Pickering Drops Probed by Electric Field Induced Stressnb_NO
dc.typeJournal articlenb_NO
dc.typePeer reviewednb_NO
dc.description.versionpublishedVersionnb_NO
dc.source.pagenumber436-?nb_NO
dc.source.volume10nb_NO
dc.source.journalMaterialsnb_NO
dc.identifier.doi10.3390/ma10040436
dc.identifier.cristin1478526
dc.description.localcode©2017 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open accessarticle distributed under the terms and conditions of the Creative Commons Attribution(CC BY) license (http://creativecommons.org/licenses/by/4.0/).nb_NO
cristin.unitcode194,63,35,0
cristin.unitcode194,66,20,0
cristin.unitnameInstitutt for elektronikk og telekommunikasjon
cristin.unitnameInstitutt for fysikk
cristin.ispublishedtrue
cristin.fulltextoriginal
cristin.qualitycode1


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Navngivelse 4.0 Internasjonal
Except where otherwise noted, this item's license is described as Navngivelse 4.0 Internasjonal